29
2014
-
04
XXX shows the latest production test technology
Classification:
【概要描述】XXX, the world's leading high-tech enterprise, has recently participated in a number of measuring instrument exhibitions, including the 2004 Shanghai International Electronic Production Equipment and Microelectronics Industry Exhibition (Nepcon) and the 2004 Electronic Measuring Instrument Exhibition in Wuhan.
xxx said that SP50/SJ50 automatic optical detection using SSM technology is currently the only lead-free solution in the AOI industry. SSM technology, on the other hand, provides the highest defect alarm accuracy, ease of use, and improved process feedback capabilities. XXX's AOI solution can use the same hardware platform to realize AOI detection and 3D solder paste detection after the furnace, which not only provides flexibility, but also saves equipment investment for customers.At the same time, xxx also exhibited its new generation of vectorless test technology VTEP. It provides a solution for non-vector testing of packaged devices such as SMT connectors, BGA and SOP. According to introduction, VTEP can detect the open circuit or short circuit of various devices including BGA and SMT connectors on PCB board. At the same time, automatic silicon nails (Automated Silicon Nails) can be used to extend the test range to some nodes inside integrated circuits through boundary scan equipment.
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